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VLSI - Design For Test (DFT)- JTAG, Boundary SCAN and IJTAG - Udemy Coupon | Comidoc

VLSI - Design For Test (DFT)- JTAG, Boundary SCAN and IJTAG

A detailed review of concepts described in IEEE 1149.1 and IEEE 1687-2014

Udemy course/IT & Software/Hardware

VLSI - Design For Test (DFT)- JTAG, Boundary SCAN and IJTAG

InstructorVLSI Foundation

Duration2h

Students3,762

Rating4.1 (716)

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