VLSI - Design For Test (DFT)- JTAG, Boundary SCAN and IJTAG
A detailed review of concepts described in IEEE 1149.1 and IEEE 1687-2014
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May 2021
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IJTAG, JTAG and BSDL. DFT concepts
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3340060
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17/07/2020
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21/10/2020
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