VLSI - Design For Test (DFT)- JTAG, Boundary SCAN and IJTAG

Master VLSI Design for Test (DFT): Unlock the Secrets of JTAG, Boundary SCAN, and IJTAG 🎓

Are you ready to dive deep into the world of VLSI Design for Test (DFT)? This comprehensive course is your gateway to understanding the intricacies of JTAG, Boundary Scan, and IJTAG, as outlined in the IEEE 1149.1 and IEEE 1687-2014 standards. Join us on this journey to master DFT techniques that are essential for reliable product testing and fault diagnosis.

Course Overview:

🎯 Key Learning Objectives:

• Detailed Concepts on JTAG and Boundary Scan: Learn the fundamentals of the Joint Test Action Group (JTAG) and Boundary Scan, including their applications and benefits.
• In-Depth Understanding of IEEE 1149.1 & IEEE 1687-2014 Standards: Get an in-depth look at the standards that govern DFT, and how they are applied in real-world scenarios.
• JTAG's TAP State Machine Explained: Uncover the workings of the Test Access Port (TAP) state machine, and understand its role in testing complex systems on a Printed Circuit Board (PCB).
• IJTAG and its Advancements: Discover the concepts behind Incremental JTAG (IJTAG), including Instruction Compatibility Layer (ICL) and Parameter Description Language (PDL).

Course Breakdown:

📚 What You Will Learn:

• JTAG/Boundary Scan Basics: We'll start by introducing the JTAG standard, its history, and its role in testing complex integrated circuits (ICs).
• The TAP State Machine: Delve into the state machine of JTAG, understanding each state and their significance. Learn how to implement and use it for efficient connectivity testing.
• IEEE 1149.1 Explained: Understand the IEEE 1149.1 standard in detail, including its objectives, key features, and implementation considerations.
• Introduction to IEEE 1687-2014: Explore the enhanced capabilities of IEEE 1687-2014 for test access control, its advantages over previous versions, and how it complements JTAG.
• IJTAG Deep Dive: Get hands-on with Incremental JTAG, learning about ICL and PDL, and see how it extends the capabilities of JTAG.

Why Take This Course?

🚀 Why You Should Enroll:

• Real-World Application: Learn by doing! This course is packed with practical examples that bring theoretical concepts to life.
• Expert Instruction: Gain insights from industry experts who specialize in VLSI DFT.
• Advance Your Career: Stand out in the field of VLSI and embedded systems by mastering advanced testing techniques.
• Network with Peers: Engage with a community of like-minded professionals and expand your professional network.

Course Features:

🚀 Take the first step towards mastering VLSI Design for Test. Enroll now and unlock the potential of your electronic designs with our expert-led course on JTAG, Boundary Scan, and IJTAG! 🚀

Whether you're a seasoned engineer or just starting out in the field of VLSI and embedded systems, this course offers you a deep dive into the world of Design for Test (DFT). With a focus on JTAG, Boundary Scan, IJTAG, and the relevant IEEE standards, you'll gain the knowledge and skills needed to ensure your designs are testable and reliable. Don't miss out on this opportunity to enhance your expertise in VLSI testing methodologies! Enroll today and transform your approach to testing electronic systems.